Other For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices HTS Code 9031497000
Classified under Section HS: Harmonized System
Tariff Rates last synced: Apr 2026 (USITC)
Trade Volume last synced: Q4 2023 (US Census)
Import Duty Rates for 9031497000
General Duty Rate (Column 1)
Free
Normal Trade Relations (NTR)
Special Duty Rate
Free
Applicable Programs:
A CA MX KR
Unit of Measure (UOM)
No.
US Import Market Intelligence Sourced from US Census
Annual Import Volume (USD)
Volume data not available for this specific code.
Top States of Destination
State data not available.
Top Ports of Entry
Port data not available.
Customs Rulings (CROSS) for 9031497000
No recent binding rulings found.
This code is classified under Section HS (Harmonized System), Chapter 90 (Chapter 90), regulating the import of Other For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices.
Legal Notes (Section HS)
No specific legal notes found for this context level.